[IEEE 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Tucson, AZ, USA (2017.9.10-2017.9.14)] 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Charged device ESD threats with high speed RF interfaces
Tamminen, Pasi, Fung, Rita, Wong, RichardYear:
2017
Language:
english
DOI:
10.23919/EOSESD.2017.8073429
File:
PDF, 1.29 MB
english, 2017