[IEEE 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Tucson, AZ, USA (2017.9.10-2017.9.14)] 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - HV latchup — Power analog ICs co-design with block level verification
Mitchell, Todd, Vashchenko, Vladislav, Meeks, TerryYear:
2017
Language:
english
DOI:
10.23919/eosesd.2017.8073434
File:
PDF, 1.44 MB
english, 2017