[IEEE 2017 39th Electrical Overstress/Electrostatic...

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[IEEE 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Tucson, AZ, USA (2017.9.10-2017.9.14)] 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - HV latchup — Power analog ICs co-design with block level verification

Mitchell, Todd, Vashchenko, Vladislav, Meeks, Terry
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Year:
2017
Language:
english
DOI:
10.23919/eosesd.2017.8073434
File:
PDF, 1.44 MB
english, 2017
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