Stability of miniaturized non-trimmed thick- and thin-film resistors
Rovensky, Tibor, Pietrikova, Alena, Vehec, Igor, Livovsky, LubomirVolume:
84
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.03.011
Date:
May, 2018
File:
PDF, 1.14 MB
english, 2018