Analysis of proton irradiated n- and p-type strained...

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Semiconductor Science and Technology 2018 / 03

Analysis of proton irradiated n- and p-type strained finfets at low temperatures down to 100 k

Caparroz, Luis Felipe Vicentis, Bordallo, Caio Cesar Mendes, Martino, Joao Antonio, Simoen, Eddy, Claeys, Cor, Agopian, Paula Ghedini Der
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Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/1361-6641/aabab3
Date:
March, 2018
File:
PDF, 633 KB
english, 2018
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