[IEEE 2018 31st International Conference on VLSI Design and 2018 17th International Conference on Embedded Systems (VLSID) - Pune, India (2018.1.6-2018.1.10)] 2018 31st International Conference on VLSI Design and 2018 17th International Conference on Embedded Systems (VLSID) - On the ESD Reliability Issues in Carbon Electronics: Graphene and Carbon Nano Tubes
Kranthi, Nagothu Karmel, Mishra, Abhishek, Meersha, Adil, Shrivastava, MayankYear:
2018
Language:
english
DOI:
10.1109/VLSID.2018.117
File:
PDF, 639 KB
english, 2018