The Conflict between U.S. Patent Protection and Technological Innovation: Analysis and Problem Solving by Means of the Integrated Causal Model for Innovated Ethic
Chumney, Wade M., Wasieleski, David M., Schumacher, E. GünterVolume:
122
Language:
english
Journal:
Business and Society Review
DOI:
10.1111/basr.12130
Date:
December, 2017
File:
PDF, 183 KB
english, 2017