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Failure mode analysis of MEMS suspended inductors under mechanical shock
Li, Yiyuan, Li, Jianhua, Xu, LixinVolume:
85
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.03.041
Date:
June, 2018
File:
PDF, 2.84 MB
english, 2018