Energy-dependent etching-related impacts on CR-39 alpha...

Energy-dependent etching-related impacts on CR-39 alpha detection efficiency for the Rn-222 and Rn-220 decay chains

Tan, Y., Yuan, H., Kearfott, K.J.
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Volume:
13
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/13/04/T04005
Date:
April, 2018
File:
PDF, 419 KB
english, 2018
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