The electrical resistivity of rough thin films: A model...

Journal of Applied Physics 2018 / 04 Vol. 123; Iss. 15

The electrical resistivity of rough thin films: A model based on electron reflection at discrete step edges

Zhou, Tianji, Zheng, Pengyuan, Pandey, Sumeet C., Sundararaman, Ravishankar, Gall, Daniel
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Volume:
123
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.5020577
Date:
April, 2018
File:
PDF, 878 KB
english, 2018
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