![](/img/cover-not-exists.png)
Surface Stoichiometry Analysis by AES, EELS Spectroscopy and AFM Microscopy in UHV Atmosphere of SnO 2 Thin Film
Lounis, Zakia, Bouslama, M’hamed, Zegadi, Choucki, Ghaffor, Djamel, Gazzoul, M’hamed, Baizid, Abdelhak, Halati, M.Salah, Kharroubi, Bachir, Besahraoui, Fatiha, Ouerdane, AbdallahLanguage:
english
Journal:
Journal of Electron Spectroscopy and Related Phenomena
DOI:
10.1016/j.elspec.2018.04.006
Date:
April, 2018
File:
PDF, 494 KB
english, 2018