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Cross Project Defect Prediction Using Class Distribution Estimation and Oversampling
Limsettho, Nachai, Bennin, Kwabena Ebo, Keung, Jacky W., Hata, Hideaki, Matsumoto, KenichiLanguage:
english
Journal:
Information and Software Technology
DOI:
10.1016/j.infsof.2018.04.001
Date:
April, 2018
File:
PDF, 4.13 MB
english, 2018