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AIP Conference Proceedings [AIP Publishing LLC INTERNATIONAL CONFERENCE ON DEFECTS IN SEMICONDUCTORS 2013: Proceedings of the 27th International Conference on Defects in Semiconductors, ICDS-2013 - Bologna, Italy (21–26 July 2013)] - Negative-U centers as a basis of topological edge channels
Bagraev, Nikolay, Danilovskii, Eduard, Gehlhoff, Wolfgang, Klyachkin, Leonid, Kudryavtsev, Andrey, Malyarenko, Anna, Mashkov, VladimirYear:
2014
Language:
english
DOI:
10.1063/1.4865644
File:
PDF, 1.08 MB
english, 2014