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[Frontiers in Electronic Testing] Timing Performance of Nanometer Digital Circuits Under Process Variations Volume 39 || Designing with FinFETs and Process Variation Impact
Champac, Victor, Garcia Gervacio, JoseVolume:
10.1007/97
Year:
2018
Language:
english
DOI:
10.1007/978-3-319-75465-9_7
File:
PDF, 1.45 MB
english, 2018