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Defect characterization of amorphous silicon thin film solar cell based on low frequency noise
Hu, Linna, He, Liang, Chen, Hua, Jia, Xiaofei, Hu, Ying, Ma, Hongmei, Guo, Dandan, Qin, YuVolume:
61
Language:
english
Journal:
Science China Information Sciences
DOI:
10.1007/s11432-017-9360-7
Date:
June, 2018
File:
PDF, 150 KB
english, 2018