Controlled electromigration protocol revised
Zharinov, Vyacheslav S., Baumans, Xavier D. A., Silhanek, Alejandro V., Janssens, Ewald, Van de Vondel, JorisVolume:
89
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.5011953
Date:
April, 2018
File:
PDF, 1.76 MB
english, 2018