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[IEEE 2017 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) - Abu Dhabi (2017.10.23-2017.10.25)] 2017 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) - Defect-aware synthesis for reconfigurable single-electron transistor arrays
Huang, Juinn-Dar, Chen, Yi-Hang, Lu, Jia-ShinYear:
2017
Language:
english
DOI:
10.1109/vlsi-soc.2017.8203487
File:
PDF, 797 KB
english, 2017