Development of high-temperature microsample testing

Development of high-temperature microsample testing

M. Zupan, M. J. Hayden, C. J. Boehlert, K. J. Hemker
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Volume:
41
Language:
english
Pages:
6
DOI:
10.1007/bf02323140
Date:
September, 2001
File:
PDF, 1.05 MB
english, 2001
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