On Randomness Exposure Resilience of Group Signatures
ONO, Tomoyoshi, YONEYAMA, KazukiVolume:
E100.D
Year:
2017
Language:
english
Journal:
IEICE Transactions on Information and Systems
DOI:
10.1587/transinf.2016INP0015
File:
PDF, 267 KB
english, 2017