An efficient built-in self test method for robust path...

Journal of Electronic Testing 1996 / 04 Vol. 8; Iss. 2

An efficient built-in self test method for robust path delay fault testing

Ioannis Voyiatzis, Antonis Paschalis, Dimitrios Nikolos, Constantin Halatsis
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Volume:
8
Language:
english
Pages:
4
DOI:
10.1007/bf02341826
Date:
April, 1996
File:
PDF, 246 KB
english, 1996
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