Stress Analysis of Transistor Structures Considering the...

Stress Analysis of Transistor Structures Considering the Internal Stress of Thin Films

MIURA, Hideo, ISHITSUKA, Norio, SAITO, Naoto, OHTA, Hiroyuki, HASHIMOTO, Chiemi, IKEDA, Shuji
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Volume:
39
Year:
1996
Journal:
JSME international journal. Ser. A, Mechanics and material engineering
DOI:
10.1299/jsmea1993.39.2_166
File:
PDF, 776 KB
1996
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