Scanning Electrochemical Microscopy as a Characterization...

Scanning Electrochemical Microscopy as a Characterization Tool for Reduced Graphene Oxide Field Effect Transistors

Reiner-Rozman, Ciril, Schodl, J&uuml, rgen, Nowak, Christoph, Kleber, Christoph
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Volume:
13
Year:
2015
Language:
english
Journal:
e-Journal of Surface Science and Nanotechnology
DOI:
10.1380/ejssnt.2015.366
File:
PDF, 2.84 MB
english, 2015
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