Improving Small-Delay Fault Coverage of On-Chip Delay...

IEICE Transactions on Information and Systems 2014 Vol. E97.D; Iss. 10

Improving Small-Delay Fault Coverage of On-Chip Delay Measurement by Segmented Scan and Test Point Insertion

ZHANG, Wenpo, NAMBA, Kazuteru, ITO, Hideo
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Volume:
E97.D
Year:
2014
Language:
english
Journal:
IEICE Transactions on Information and Systems
DOI:
10.1587/transinf.2014edp7110
File:
PDF, 752 KB
english, 2014
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