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Lines of Comments as a Noteworthy Metric for Analyzing Fault-Proneness in Methods
AMAN, Hirohisa, AMASAKI, Sousuke, SASAKI, Takashi, KAWAHARA, MinoruVolume:
E98.D
Year:
2015
Language:
english
Journal:
IEICE Transactions on Information and Systems
DOI:
10.1587/transinf.2015edp7107
File:
PDF, 616 KB
english, 2015