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Scan Shift Time Reduction Using Test Compaction for On-Chip Delay Measurement
ZHANG, Wenpo, NAMBA, Kazuteru, ITO, HideoVolume:
E97.D
Year:
2014
Language:
english
Journal:
IEICE Transactions on Information and Systems
DOI:
10.1587/transinf.e97.d.533
File:
PDF, 436 KB
english, 2014