Tests of automatic data quality control by the CIE TC307 guide
Nakamura, Hiroshi, Koga, Yasuko, Shibata, Yo, Ota, Yuichiro, Otsuru, ToruVolume:
75
Year:
1991
DOI:
10.2150/jieij1980.75.appendix_114
File:
PDF, 361 KB
1991