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[IEEE 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Dresden, Germany (2018.3.19-2018.3.23)] 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Power optimization through peripheral circuit reusing integrated with loop tiling for RRAM crossbar-based CNN
Ni, Yuanhui, Chen, Weiwen, Cui, Wenjuan, Zhou, Yuanchun, Qiu, KeniYear:
2018
Language:
english
DOI:
10.23919/DATE.2018.8342193
File:
PDF, 855 KB
english, 2018