ChemInform Abstract: NEW FAST TECHNIQUE FOR LARGE-SCALE...

ChemInform Abstract: NEW FAST TECHNIQUE FOR LARGE-SCALE MEASUREMENTS OF GENERATION LIFETIME IN SEMICONDUCTORS

FAHRNER, WOLFGANG R., SCHNEIDER, CHRISTIAN P.
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Volume:
7
Journal:
Chemischer Informationsdienst
DOI:
10.1002/chin.197617012
Date:
April, 1976
File:
PDF, 110 KB
1976
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