ChemInform Abstract: NEW FAST TECHNIQUE FOR LARGE-SCALE MEASUREMENTS OF GENERATION LIFETIME IN SEMICONDUCTORS
FAHRNER, WOLFGANG R., SCHNEIDER, CHRISTIAN P.Volume:
7
Journal:
Chemischer Informationsdienst
DOI:
10.1002/chin.197617012
Date:
April, 1976
File:
PDF, 110 KB
1976