Advanced Terahertz Frequency-Domain Ellipsometry...

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IEEE Transactions on Terahertz Science and Technology 2018

Advanced Terahertz Frequency-Domain Ellipsometry Instrumentation for In Situ and Ex Situ Applications

Kuhne, Philipp, Armakavicius, Nerijus, Stanishev, Vallery, Herzinger, Craig M., Schubert, Mathias, Darakchieva, Vanya
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Terahertz Science and Technology
DOI:
10.1109/TTHZ.2018.2814347
File:
PDF, 4.04 MB
english, 2018
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