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Reliability-Enhanced ECC-Based Memory Architecture Using In-Field Self-Repair
MAYUGA, Gian, YAMATO, Yuta, YONEDA, Tomokazu, SATO, Yasuo, INOUE, MichikoVolume:
E99.D
Year:
2016
Language:
english
Journal:
IEICE Transactions on Information and Systems
DOI:
10.1587/transinf.2015edp7408
File:
PDF, 2.37 MB
english, 2016