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Inspection of Mura Image Quality by Using Frequency Analysis for Electronic Displays
ISHIGURO, Kazuyuki, ASANO, Toshio, KONDOH, Takahiro, LIU, WeiVolume:
83
Year:
2017
Journal:
Journal of the Japan Society for Precision Engineering
DOI:
10.2493/jjspe.83.258
File:
PDF, 1.80 MB
2017