Confirmation of Incorporation of Cu and Se Ions in Applied...

Journal of Electronic Materials 2018 / 4 Vol. 47; Iss. 4

Confirmation of Incorporation of Cu and Se Ions in Applied p- and n-Type-Doped Sb2S3 by Photoemission Spectroscopy

Validžić, Ivana Lj, Popović, Maja, Lojpur, Vesna, Bundaleski, Nenad, Rakočević, Zlatko
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
47
Language:
english
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-018-6072-5
Date:
April, 2018
File:
PDF, 1.40 MB
english, 2018
Conversion to is in progress
Conversion to is failed