[IEEE 2018 IEEE Applied Power Electronics Conference and Exposition (APEC) - San Antonio, TX, USA (2018.3.4-2018.3.8)] 2018 IEEE Applied Power Electronics Conference and Exposition (APEC) - A behavioral transient model of IGBT for switching cell power loss estimation in electromagnetic transient simulation
Xu, Yanming, Ho, Carl Ngai Man, Ghosh, Avishek, Muthumuni, DharshanaYear:
2018
Language:
english
DOI:
10.1109/APEC.2018.8341021
File:
PDF, 973 KB
english, 2018