[IEEE 2017 6th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) - Noida, India (2017.9.20-2017.9.22)] 2017 6th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) - Intra-ocular lens defect detection using generalized hough transform
Jothi, Adityan, Jayaram, Shrinivas, Yogesh,, Dubey, A. K.Year:
2017
Language:
english
DOI:
10.1109/ICRITO.2017.8342420
File:
PDF, 374 KB
english, 2017