Comparative Study of Cross-Point MRAM Array With...

IEEE Electron Device Letters 2018 / 5 Vol. 39; Iss. 5

Comparative Study of Cross-Point MRAM Array With Exponential and Threshold Selectors for Read Operation

Woo, Jiyong, Yu, Shimeng
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Volume:
39
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2018.2821093
Date:
May, 2018
File:
PDF, 989 KB
english, 2018
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