[IEEE 2017 IEEE/MTT-S International Microwave Symposium -...

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[IEEE 2017 IEEE/MTT-S International Microwave Symposium - IMS 2017 - Honololu, HI, USA (2017.6.4-2017.6.9)] 2017 IEEE MTT-S International Microwave Symposium (IMS) - Linearity improvement method of fast-chirp signal for PLL by using frequency detector and division ratio modification

Wada, Osamu, Mizutani, Hiroyuki, Nakamizo, Hideyuki, Tajima, Kenichi
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Year:
2017
Language:
english
DOI:
10.1109/MWSYM.2017.8058884
File:
PDF, 567 KB
english, 2017
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