Reducing Rollback Cost in VLSI Circuits to Improve Fault...

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IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2018

Reducing Rollback Cost in VLSI Circuits to Improve Fault Tolerance

Bonnoit, Thierry, Zergainoh, Nacer-Eddine, Nicolaidis, Michael
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2018.2818021
File:
PDF, 4.79 MB
english, 2018
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