[IEEE 2018 Design, Automation & Test in Europe...

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[IEEE 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Dresden, Germany (2018.3.19-2018.3.23)] 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - An analysis on retention error behavior and power consumption of recent DDR4 DRAMs

Mathew, Deepak M., Schultheis, Martin, Rheinlander, Carl C., Sudarshan, Chirag, Weis, Christian, Wehn, Norbert, Jung, Matthias
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Year:
2018
Language:
english
DOI:
10.23919/DATE.2018.8342023
File:
PDF, 535 KB
english, 2018
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