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[IEEE 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Dresden, Germany (2018.3.19-2018.3.23)] 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Using multifunctional standardized stack as universal spintronic technology for IoT
Tahoori, M., Nair, S. M., Bishnoi, R., Senni, S., Mohdad, J., Mailly, F., Torres, L., Benoit, P., Gamatie, A., Nouet, P., Ouattara, F., Sassatelli, G., Jabeur, K., Vanhauwaert, P., Atitoaie, A., FirasYear:
2018
Language:
english
DOI:
10.23919/DATE.2018.8342143
File:
PDF, 12.86 MB
english, 2018