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[IEEE 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Dresden, Germany (2018.3.19-2018.3.23)] 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - IoT security assessment through the interfaces P-SCAN test bench platform
Maurin, Thomas, Ducreux, Laurent-Frederic, Caraiman, George, Sissoko, PhilippeYear:
2018
Language:
english
DOI:
10.23919/DATE.2018.8342159
File:
PDF, 168 KB
english, 2018