European Microscopy Congress 2016: Proceedings ||...

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European Microscopy Congress 2016: Proceedings || Application of Cryogenic Focused Ion Beam Scanning Electron Microcopy to Hydrogel Characterisation

Parmenter, Chris
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Year:
2016
Language:
english
DOI:
10.1002/9783527808465.EMC2016.5792
File:
PDF, 3.11 MB
english, 2016
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