Potential failure mode identification of operational...

Microelectronics Reliability 2018 / 06 Vol. 85

Potential failure mode identification of operational amplifier circuit board by using high accelerated limit test

Sakamoto, Junji, Hirata, Ryoma, Shibutani, Tadahiro
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Volume:
85
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.04.005
Date:
June, 2018
File:
PDF, 1.45 MB
english, 2018
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