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System identification-based frequency domain feature extraction for defect detection and characterization
Li, Ping, Lang, Zi–Qiang, Zhao, Ling, Tian, GuiYun, Neasham, Jeffrey A., Zhang, Jun, Graham, David J.Volume:
98
Language:
english
Journal:
NDT & E International
DOI:
10.1016/j.ndteint.2018.04.008
Date:
September, 2018
File:
PDF, 2.30 MB
english, 2018