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[IEEE 2018 IEEE Applied Power Electronics Conference and Exposition (APEC) - San Antonio, TX, USA (2018.3.4-2018.3.8)] 2018 IEEE Applied Power Electronics Conference and Exposition (APEC) - Adaptive detection of DC Arc faults based on hurst exponents and current envelope
Abdullah, Yousef, Hu, Boxue, Wei, Zhou, Wang, Jin, Emrani, AminYear:
2018
Language:
english
DOI:
10.1109/APEC.2018.8341590
File:
PDF, 1.78 MB
english, 2018