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[IEEE 2017 International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Hsinchu (2017.10.18-2017.10.20)] 2017 International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Robust TFET SRAM cell for ultra-low power IoT application
Ahmad, Sayeed, Alam, Naushad, Hasan, MohdYear:
2017
Language:
english
DOI:
10.1109/EDSSC.2017.8333231
File:
PDF, 410 KB
english, 2017