[IEEE 2017 First International Conference on Electronics Instrumentation & Information Systems (EIIS) - Harbin (2017.6.3-2017.6.5)] 2017 First International Conference on Electronics Instrumentation & Information Systems (EIIS) - SMT patch defect detection algorithm based on prior information of image
Gan, Zhang, Yaoyao, Ma, Chun-long, Zhang, Wei, Li, Zhe, Sun, Yu-zhi, TanYear:
2017
Language:
english
DOI:
10.1109/EIIS.2017.8298606
File:
PDF, 298 KB
english, 2017