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BCB Evaluation of High-Performance and Low-Leakage Three-Independent-Gate Field Effect Transistors
Romero-Gonzalez, Jorge, Gaillardon, Pierre-EmmanuelYear:
2018
Language:
english
Journal:
IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
DOI:
10.1109/JXCDC.2018.2821638
File:
PDF, 638 KB
english, 2018