A Linearity-Improved 8-bit 320-MS/s SAR ADC With Metastability Immunity Technique
Xu, Daiguo, Qiu, Lei, Zhang, Zhengping, Liu, Tao, Liu, Lu, Chen, Kairang, Xu, ShiliuYear:
2018
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2018.2822678
File:
PDF, 2.58 MB
english, 2018