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[IEEE 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) - Strasbourg, France (2016.10.29-2016.11.6)] 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) - Rapid measurement of fluorescence lifetimes using SiPM detection and waveform sampling
Tsai, H.-M., Souris, J.S., Kim, H.-J., Cheng, S.-H., Chen, C-T., Lo, L.-W., Chen, L., Kao, C.-M.Year:
2016
Language:
english
DOI:
10.1109/nssmic.2016.8069566
File:
PDF, 440 KB
english, 2016