![](/img/cover-not-exists.png)
A simple technique for determining yield strength of thin films
M. H. Gordon, W. F. Schmidt, Q. Qiao, B. Huang, S. S. AngVolume:
42
Language:
english
Pages:
5
DOI:
10.1007/bf02410977
Date:
September, 2002
File:
PDF, 985 KB
english, 2002