[IEEE 2018 Design, Automation & Test in Europe...

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[IEEE 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Dresden, Germany (2018.3.19-2018.3.23)] 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - ReRAM-based accelerator for deep learning

Li, Bing, Song, Linghao, Chen, Fan, Qian, Xuehai, Chen, Yiran, Li, Hai Helen
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Year:
2018
Language:
english
DOI:
10.23919/DATE.2018.8342118
File:
PDF, 348 KB
english, 2018
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