[IEEE 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Dresden, Germany (2018.3.19-2018.3.23)] 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - ReRAM-based accelerator for deep learning
Li, Bing, Song, Linghao, Chen, Fan, Qian, Xuehai, Chen, Yiran, Li, Hai HelenYear:
2018
Language:
english
DOI:
10.23919/DATE.2018.8342118
File:
PDF, 348 KB
english, 2018